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  cy62147ev30 mobl ? 4-mbit (256 k 16) static ram cypress semiconductor corporation ? 198 champion court ? san jose , ca 95134-1709 ? 408-943-2600 document number: 38-05440 rev. *n revised august 22, 2013 4-mbit (256 k 16) static ram features very high speed: 45 ns temperature ranges ? industrial: ?40 c to +85 c wide voltage range: 2.20 v to 3.60 v pin compatible with cy62147dv30 ultra low standby power ? typical standby current: 1 ? a ? maximum standby current: 7 ? a (industrial) ultra low active power ? typical active current: 2 ma at f = 1 mhz easy memory expansion with ce [1] and oe features automatic power-down when deselected complementary metal oxide semiconductor (cmos) for optimum speed and power available in pb-free 48-ball very fine ball grid array (vfbga) (single/dual ce option) and 44-pin thin small outline package (tsop) ii packages byte power-down feature functional description the cy62147ev30 is a high performance cmos static ram (sram) organized as 256 k words by 16 bits. this device features advanced circuit design to provide ultra low active current. it is ideal for providing more battery life? (mobl ? ) in portable applications such as cellular telephones. the device also has an automatic power down feature that significantly reduces power consumption when addresses are not toggling. placing the device into standby mode reduces power consumption by more than 99 percent when deselected (ce high or both ble and bhe are high). the input and output pins (i/o 0 through i/o 15 ) are placed in a high impedance state when: deselected (ce high) outputs are disabled (oe high) both byte high enable and byte low enable are disabled (bhe , ble high) write operation is active (ce low and we low) to write to the device, take chip enable (ce ) and write enable (we ) inputs low. if byte low enable (ble ) is low, then data from i/o pins (i/o 0 through i/o 7 ) is written into the location specified on the address pins (a 0 through a 17 ). if byte high enable (bhe ) is low, then data from i/o pins (i/o 8 through i/o 15 ) is written into the location specified on the address pins (a 0 through a 17 ). to read from the device, take chip enable (ce ) and output enable (oe ) low while forcing the write enable (we ) high. if byte low enable (ble ) is low, then data from the memory location specified by the address pins appear on i/o 0 to i/o 7 . if byte high enable (bhe ) is low, then data from memory appears on i/o 8 to i/o 15 . see the truth table on page 11 for a complete description of read and write modes. 256k x 16 ram array i/o 0 ?i/o 7 row decoder a 8 a 7 a 6 a 5 a 2 column decoder a 11 a 12 a 13 a 14 a 15 sense amps data in drivers oe a 4 a 3 i/o 8 ?i/o 15 ce [1] we bhe a 16 a 0 a 1 a 9 a 10 ble a 17 bhe ble ce power down circuit logic block diagram note 1. bga packaged device is offered in single ce and dual ce options. in this data sheet, for a dual ce device, ce refers to the internal logical combination of ce 1 and ce 2 such that when ce 1 is low and ce 2 is high, ce is low. for all other cases ce is high.
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 2 of 18 contents product portfolio .............................................................. 3 pin configurations ........................................................... 3 maximum ratings ............................................................. 4 operating range ............................................................... 4 electrical characteristics ................................................. 4 capacitance ...................................................................... 5 thermal resistance .......................................................... 5 ac test load and waveforms ......................................... 5 data retention characteristics ....................................... 6 data retention waveform ................................................ 6 switching characteristics ................................................ 7 switching waveforms ...................................................... 8 truth table ...................................................................... 11 ordering information ...................................................... 12 ordering code definitions ..... .................................... 12 package diagrams .......................................................... 13 acronyms ........................................................................ 15 document conventions ................................................. 15 units of measure ....................................................... 15 document history page ................................................. 16 sales, solutions, and legal information ...................... 18 worldwide sales and design s upport ......... .............. 18 products .................................................................... 18 psoc? solutions ...................................................... 18 cypress developer community ................................. 18 technical support ................. .................................... 18
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 3 of 18 product portfolio product range v cc range (v) speed (ns) power dissipation operating i cc (ma) standby i sb2 ( ? a) f = 1 mhz f = f max min typ [2] max typ [2] max typ [2] max typ [2] max cy62147ev30ll industrial 2.2 3.0 3.6 45 ns 2 2.5 15 20 1 7 pin configurations figure 1. 48-ball vfbga (single chip enable) [3, 4] figure 2. 48-ball vfbga (dual chip enable) [3, 4] figure 3. 44-pin tsop ii [3] we a 11 a 10 a 6 a 0 a 3 ce i/o 10 i/o 8 i/o 9 a 4 a 5 i/o 11 i/o 13 i/o 12 i/o 14 i/o 15 v ss a 9 a 8 oe a 7 i/o 0 bhe nc a 2 a 1 ble i/o 2 i/o 1 i/o 3 i/o 4 i/o 5 i/o 6 i/o 7 a 15 a 14 a 13 a 12 nc nc nc 3 26 5 4 1 d e b a c f g h a 16 nc v cc v cc v ss a 17 we a 11 a 10 a 6 a 0 a 3 ce 1 i/o 10 i/o 8 i/o 9 a 4 a 5 i/o 11 i/o 13 i/o 12 i/o 14 i/o 15 v ss a 9 a 8 oe a 7 i/o 0 bhe ce 2 a 2 a 1 ble i/o 2 i/o 1 i/o 3 i/o 4 i/o 5 i/o 6 i/o 7 a 15 a 14 a 13 a 12 nc nc nc 3 26 5 4 1 d e b a c f g h a 16 nc v cc v cc v ss a 17 1 2 3 4 5 6 7 8 9 11 14 31 32 36 35 34 33 37 40 39 38 12 13 41 44 43 42 16 15 29 30 a 5 18 17 20 19 27 28 25 26 22 21 23 24 a 6 a 7 a 4 a 3 a 2 a 1 a 0 a 15 a 16 a 8 a 9 a 10 a 11 a 13 a 14 a 12 oe bhe ble ce we i/o 0 i/o 1 i/o 2 i/o 3 i/o 4 i/o 5 i/o 6 i/o 7 i/o 8 i/o 9 i/o 10 i/o 11 i/o 12 i/o 13 i/o 14 i/o 15 v cc v cc v ss v ss nc 10 a 17 notes 2. typical values are included for reference only and are no t guaranteed or tested. typical values are measured at v cc = v cc(typ) , t a = 25 c. 3. nc pins are not connected on the die. 4. pins h1, g2, and h6 in the bga package are address expansion pins for 8 mb, 16 mb, and 32 mb, respectively.
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 4 of 18 maximum ratings exceeding the maximum ratings may impair the useful life of the device. user guidelines are not tested. storage temperature ............................... ?65 c to + 150 c ambient temperature with power applied ............ ............... ............... ?55 c to +125 c supply voltage to ground potential ........................ ?0.3 v to + 3.9 v (v cc(max) + 0.3 v) dc voltage applied to outputs in high z state [5, 6] .......... ?0.3 v to 3.9 v (v cc(max) + 0.3 v) dc input voltage [5, 6] ....... ?0.3 v to 3.9 v (v cc(max) + 0.3 v) output current into outputs (low) ............................. 20 ma static discharge voltage (mil-std-883, method 3015) ................................ > 2001 v latch-up current .................................................... > 200 ma operating range device range ambient temperature v cc [7] cy62147ev30ll industrial ?40 c to +85 c 2.2 v to 3.6 v electrical characteristics over the operating range parameter description test conditions 45 ns (industrial) unit min typ [8] max v oh output high voltage i oh = ?0.1 ma 2.0 ? ? v i oh = ?1.0 ma, v cc > 2.70 v 2.4 ? ? v v ol output low voltage i ol = 0.1 ma ? ? 0.4 v i ol = 2.1 ma, v cc = 2.70 v ? ? 0.4 v v ih input high voltage v cc = 2.2 v to 2.7 v 1.8 ? v cc + 0.3 v v cc = 2.7 v to 3.6 v 2.2 ? v cc + 0.3 v v il input low voltage v cc = 2.2 v to 2.7 v ?0.3 ? 0.6 v v cc = 2.7 v to 3.6 v ?0.3 ? 0.8 v i ix input leakage current gnd < v i < v cc ?1 ? +1 ? a i oz output leakage current gnd < v o < v cc , output disabled ?1 ? +1 ? a i cc v cc operating supply current f = f max = 1/t rc v cc = v cc(max) i out = 0 ma cmos levels ?1520ma f = 1 mhz ? 2 2.5 i sb1 [9] automatic ce power-down current ? cmos inputs ce > v cc ? 0.2 v, v in > v cc ? 0.2 v, v in < 0.2 v, f = f max (address and data only), f = 0 (oe , bhe , ble and we ), v cc = 3.60 v ?17 ? a i sb2 [9] automatic ce power-down current ? cmos inputs ce > v cc ? 0.2 v, v in > v cc ? 0.2 v or v in < 0.2 v, f = 0, v cc = 3.60 v ?17 ? a notes 5. v il(min) = ?2.0 v for pulse durations less than 20 ns. 6. v ih(max) = v cc + 0.75 v for pulse durations less than 20 ns. 7. full device ac operation assumes a minimum of 100 ? s ramp time from 0 to v cc(min) and 200 ? s wait time after v cc stabilization. 8. typical values are included for reference only and are no t guaranteed or tested. typical values are measured at v cc = v cc(typ) , t a = 25 c. 9. chip enable (ce ) and byte enables (bhe and ble ) need to be tied to cmos levels to meet the i sb1 / i sb2 / i ccdr spec. other inputs can be left floating.
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 5 of 18 capacitance parameter [10] description test conditions max unit c in input capacitance t a = 25 c, f = 1 mhz, v cc = v cc(typ) 10 pf c out output capacitance 10 pf thermal resistance parameter [10] description test conditions 48-ball vfbga package 44-pin tsop ii package unit ? ja thermal resistance (junction to ambient) still air, soldered on a 3 4.5 inch, two-layer printed circuit board 75 77 ? c/w ? jc thermal resistance (junction to case) 10 13 ? c/w ac test load and waveforms figure 4. ac test load and waveforms v cc v cc output r2 30 pf including jig and scope gnd 90% 10% 90% 10% rise time = 1 v/ns fall time = 1 v/ns output v all input pulses r th r1 equivalent to: thevenin equivalent parameters 2.50 v 3.0 v unit r1 16667 1103 ? r2 15385 1554 ? r th 8000 645 ? v th 1.20 1.75 v note 10. tested initially and after any design or proce ss changes that may affect these parameters.
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 6 of 18 data retention characteristics over the operating range parameter description conditions min typ [11] max unit v dr v cc for data retention 1.5 ? ? v i ccdr [12] data retention current v cc = 1.5 v, ce > v cc ? 0.2 v, v in > v cc ? 0.2 v or v in < 0.2 v ?0.87 ? a t cdr [13] chip deselect to data retention time 0??ns t r [14] operation recovery time 45 ? ? ns data retention waveform figure 5. data retention waveform [15, 16] v cc(min) v cc(min) t cdr v dr > 1.5v data retention mode t r v cc ce or bhe .ble notes 11. typical values are included for reference only and are not guaranteed or tested. typical values are measured at v cc = v cc(typ) , t a = 25 c. 12. chip enable (ce ) and byte enables (bhe and ble ) need to be tied to cmos levels to meet the i sb1 / i sb2 / i ccdr spec. other inputs can be left floating. 13. tested initially and after any design or proces s changes that may affect these parameters. 14. full device operation requires linear v cc ramp from v dr to v cc(min) > 100 ? s or stable at v cc(min) > 100 ? s. 15. bga packaged device is offered in single ce and dual ce options. in this data sheet, for a dual ce device, ce refers to the internal logical combination of ce 1 and ce 2 such that when ce 1 is low and ce 2 is high, ce is low. for all other cases ce is high. 16. bhe .ble is the and of both bhe and ble . deselect the chip by either disabling t he chip enable signals or by disabling both bhe and ble .
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 7 of 18 switching characteristics over the operating range parameter [17, 18] description 45 ns (industrial) unit min max read cycle t rc read cycle time 45 ? ns t aa address to data valid ? 45 ns t oha data hold from address change 10 ? ns t ace ce low to data valid ? 45 ns t doe oe low to data valid ? 22 ns t lzoe oe low to low z [19] 5 ? ns t hzoe oe high to high z [19, 20] ? 18 ns t lzce ce low to low z [19] 10 ? ns t hzce ce high to high z [19, 20] ? 18 ns t pu ce low to power-up 0 ? ns t pd ce high to power-down ? 45 ns t dbe ble /bhe low to data valid ? 45 ns t lzbe ble /bhe low to low z [19, 22] 5 ? ns t hzbe ble /bhe high to high z [19, 20] ? 18 ns write cycle [21] t wc write cycle time 45 ? ns t sce ce low to write end 35 ? ns t aw address setup to write end 35 ? ns t ha address hold from write end 0 ? ns t sa address setup to write start 0 ? ns t pwe we pulse width 35 ? ns t bw ble /bhe low to write end 35 ? ns t sd data setup to write end 25 ? ns t hd data hold from write end 0 ? ns t hzwe we low to high z [19, 20] ? 18 ns t lzwe we high to low z [19] 10 ? ns notes 17. test conditions for all parameters other than tri-state parame ters assume signal transition time of 3 ns (1v/ns) or less, ti ming reference levels of v cc(typ) /2, input pulse levels of 0 to v cc(typ) , and output loading of the specified i ol /i oh as shown in the figure 4 on page 5 . 18. in an earlier revision of this device, under a specific applic ation condition, read and write operations were limited to swi tching of the byte enable and/or chip enable signals as described in the application notes an13842 and an66311 . however, the issue has been fixed and in pr oduction now, and hence, these application notes are no longer applicable. they are available for download on our we bsite as they contain information on the date code of the pa rts, beyond which the fix has been in production. 19. at any temperature and voltage condition, t hzce is less than t lzce , t hzbe is less than t lzbe , t hzoe is less than t lzoe , and t hzwe is less than t lzwe for any device. 20. t hzoe , t hzce , t hzbe , and t hzwe transitions are measured when the outputs enter a high impedance state. 21. the internal write time of the memory is defined by the overlap of we , ce = v il , bhe , ble , or both = v il . all signals must be active to initiate a write and any of these signals can terminate a write by going inactive. the data input setup and hold timing must be referenced to the edge of the sig nal that terminates the write. 22. if both byte enables are toggl ed together, this value is 10 ns.
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 8 of 18 switching waveforms figure 6. read cycle no. 1: address transition controlled [23, 24] figure 7. read cycle no. 2: oe controlled [24, 25, 26] previous data valid data valid t rc t aa t oha address data out 50% 50% data valid t rc t ace t lzbe t lzce t pu i cc t hzoe t hzce t pd t hzbe t lzoe t dbe t doe impedance high i sb data out oe ce v cc supply current bhe /ble address high impedance notes 23. the device is continuously selected. oe , ce = v il , bhe , ble , or both = v il . 24. we is high for read cycle. 25. bga packaged device is offered in single ce and dual ce options. in this data sheet, for a dual ce device, ce refers to the internal logical combination of ce 1 and ce 2 such that when ce 1 is low and ce 2 is high, ce is low. for all other cases ce is high. 26. address valid before or similar to ce and bhe , ble transition low.
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 9 of 18 figure 8. write cycle no. 1: we controlled [27, 28, 29, 30] figure 9. write cycle no. 2: ce controlled [27, 28, 29, 30] switching waveforms (continued) t hd t sd t pwe t sa t ha t aw t wc t hzoe data in note 31 t bw t sce data i/o address ce we oe bhe /ble t hd t sd t pwe t ha t aw t sce t wc t hzoe data in t bw t sa ce address we data i/o oe bhe /ble note 31 notes 27. bga packaged device is offered in single ce and dual ce options. in this data sheet, for a dual ce device, ce refers to the internal logical combination of ce 1 and ce 2 such that when ce 1 is low and ce 2 is high, ce is low. for all other cases ce is high. 28. the internal write time of the memory is defined by the overlap of we , ce = v il , bhe , ble , or both = v il . all signals must be active to initiate a write and any of these signals can terminate a write by going inactive. the data input setup and hold timing must be referenced to the edge o f the signal that terminates the write. 29. data i/o is high impedance if oe = v ih . 30. if ce goes high simultaneously with we = v ih , the output remains in a high impedance state. 31. during this period, the i/os are in output state. do not apply input signals.
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 10 of 18 figure 10. write cycle no. 3: we controlled, oe low [32, 33] figure 11. write cycle no. 4: bhe /ble controlled, oe low [32, 33] switching waveforms (continued) data in t hd t sd t lzwe t pwe t sa t ha t aw t sce t wc t hzwe t bw note 34 ce address we data i/o bhe /ble t hd t sd t sa t ha t aw t wc data in t bw t sce t pwe t hzwe t lzwe note 34 data i/o address ce we bhe /ble notes 32. bga packaged device is offered in single ce and dual ce options. in this data sheet, for a dual ce device, ce refers to the internal logical combination of ce 1 and ce 2 such that when ce 1 is low and ce 2 is high, ce is low. for all other cases ce is high. 33. if ce goes high simultaneously with we = v ih , the output remains in a high impedance state. 34. during this period, the i/os are in output state. do not apply input signals.
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 11 of 18 truth table ce [35, 36] we oe bhe ble i/os mode power h x x x x high z deselect/power-down standby (i sb ) l x x h h high z deselect/power-down standby (i sb ) l hllldata out (i/o 0 ?i/o 15 ) read active (i cc ) l h l h l data out (i/o 0 ?i/o 7 ); i/o 8 ?i/o 15 in high z read active (i cc ) l h l l h data out (i/o 8 ?i/o 15 ); i/o 0 ?i/o 7 in high z read active (i cc ) l h h l l high z output disabled active (i cc ) l h h h l high z output disabled active (i cc ) l h h l h high z output disabled active (i cc ) l l x l l data in (i/o 0 ?i/o 15 ) write active (i cc ) l l x h l data in (i/o 0 ?i/o 7 ); i/o 8 ?i/o 15 in high z write active (i cc ) l l x l h data in (i/o 8 ?i/o 15 ); i/o 0 ?i/o 7 in high z write active (i cc ) notes 35. bga packaged device is offered in single ce and dual ce options. in this data sheet, for a dual ce device, ce refers to the internal logical combination of ce 1 and ce 2 such that when ce 1 is low and ce 2 is high, ce is low. for all other cases ce is high. 36. for the dual chip enable device, ce refers to the internal logical combination of ce 1 and ce 2 such that when ce 1 is low and ce 2 is high, ce is low. for all other cases ce is high. intermediate voltage levels are not pe rmitted on any of the chip enable pins (ce for the single chip enable device; ce 1 and ce 2 for the dual chip enable device).
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 12 of 18 ordering code definitions ordering information speed (ns) ordering code package diagram package type operating range 45 cy62147ev30ll-45bvi 51-85150 48-ball vfbga [37] industrial cy62147ev30ll-45bvxi 51-85150 48-ball vfbga (pb-free) [37] cy62147ev30ll-45b2xi 51-85150 48-ball vfbga (pb-free) [38] cy62147ev30ll-45zsxi 51-85087 44-pin tsop type ii (pb-free) contact your local cypress sales repres entative for availability of these parts. temperature range: i = industrial pb-free package type: xx = zs or bv or b2 zs = 44-pin tsop type ii bv = 48-ball vfbga b2 = 48-ball vfbga dual chip enable speed grade: 45 ns low power voltage range: 3 v typical process technology: e = 90 nm buswidth: 7 = 16 density: 4 = 4-mbit family code: mobl sram family company id: cy = cypress cy - 45 xx 621 4 7 e v30 ll i x notes 37. this bga package is offered with single chip enable. 38. this bga package is offered with dual chip enable.
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 13 of 18 package diagrams figure 12. 48-ball vfbga (6 8 1.0 mm) bv48/bz48 package outline, 51-85150 51-85150 *h
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 14 of 18 figure 13. 44-pin tsop z44-ii package outline, 51-85087 package diagrams (continued) 51-85087 *e
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 15 of 18 acronyms document conventions units of measure acronym description bhe byte high enable ble byte low enable ce chip enable cmos complementary metal oxide semiconductor i/o input/output oe output enable sram static random access memory tsop thin small outline package vfbga very fine-pitch ball grid array we write enable symbol unit of measure c degree celsius mhz megahertz ? a microampere ? s microsecond ma milliampere ns nanosecond ? ohm pf picofarad v volt w watt
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 16 of 18 document history page document title: cy62147ev30 mobl ? , 4-mbit (256 k 16) static ram document number: 38-05440 revision ecn orig. of change submission date description of change ** 201861 aju 01/13/04 new data sheet. *a 247009 syt see ecn changed status from advanced information to preliminary moved product portfolio to page 2 changed vcc stabilization time in footnote #8 from 100 ? s to 200 ? s removed footnote #15(t lzbe ) from previous revision changed i ccdr from 2.0 ? a to 2.5 ? a changed typo in data retention characteristics(t r ) from 100 ? s to t rc ns changed t oha from 6 ns to 10 ns for both 35 ns and 45 ns speed bin changed t hzoe , t hzbe , t hzwe from 12 to 15 ns for 35 ns speed bin and 15 to 18 ns for 45 ns speed bin changed t sce and t bw from 25 to 30 ns for 35 ns speed bin and 40 to 35 ns for 45 ns speed bin changed t hzce from 12 to 18 ns for 35 ns speed bin and 15 to 22 ns for 45 ns speed bin changed t sd from 15 to 18 ns for 35 ns speed bin and 20 to 22 ns for 45 ns speed bin changed t doe from 15 to 18 ns for 35 ns speed bin changed ordering information to include pb-free packages *b 414807 zsd see ecn changed status from preliminary information to final changed the address of cypress semiconductor corporation on page #1 from ?3901 north first street? to ?198 champion court? removed 35ns speed bin, ?l? version of cy62147ev30 changed ball e3 from dnu to nc. removed redundant foot note on dnu. changed i cc (max) value from 2 ma to 2.5 ma and i cc (typ) value from 1.5 ma to 2 ma at f = 1 mhz changed i cc (typ) value from 12 ma to 15 ma at f = f max changed i sb1 and i sb2 typ values from 0.7 ? a to 1 ? a and max values from 2.5 ? a to 7 ? a. changed i ccdr from 2.5 ? a to 7 ? a. added i ccdr typical value. changed ac test load capacitance from 50 pf to 30 pf on page #4, changed t lzoe from 3 ns to 5 ns, changed t lzce , t lzbe and t lzwe from 6 ns to 10 ns, changed t hzce from 22 ns to 18 ns, changed t pwe from 30 ns to 35 ns and changed t sd from 22 ns to 25 ns. updated the package diagram 48-pin vfbga from *b to *d updated the ordering information table and replaced the package name column with package diagram. *c 464503 nxr see ecn included automotive range in product offering updated ordering information . *d 925501 vkn see ecn added preliminary automotive-a information added footnote #9 related to i sb2 and i ccdr added footnote #14 related ac timing parameters *e 1045701 vkn see ecn converted automotive-a and automotive -e specs from preliminary to final *f 2577505 vkn / pyrs 10/03/08 added -45b2xi part (dual ce option) *g 2681901 vkn / pyrs 04/01/09 added cy62147ev30ll-45zsxa in the ordering information table *h 2886488 aju 03/02/2010 added contents . added note 36 . updated package diagrams . updated links in sales, solutions, and legal information .
cy62147ev30 mobl ? document number: 38-05440 rev. *n page 17 of 18 *i 3109050 pras 12/13/2010 changed table footnotes to notes. added ordering code definitions . *j 3123973 rame 01/31/2011 separated industri al and auto parts from this datasheet removed automotive info added acronyms and units of measure table *k 3296744 rame 08/09/2011 updated functional description (removed reference to an1064 sram system guidelines). added i sb1 to footnote 9 and 12 . notes 17 and 18 moved to parameter section of switching characteristics . added note 22 and referred the same note in the description of t lzbe parameter. *l 3456837 tava 12/06/2011 updated package diagrams . updated in new template. *m 3724736 jish 08/23/2012 fixed typo errors and minor clean-up. *n 4102445 vini 08/22/2013 updated switching characteristics : updated note 18. updated package diagrams : spec 51-85150 ? changed revision from *g to *h. spec 51-85087 ? changed revision from *d to *e. updated in new template. completing sunset review. document history page (continued) document title: cy62147ev30 mobl ? , 4-mbit (256 k 16) static ram document number: 38-05440 revision ecn orig. of change submission date description of change
document number: 38-05440 rev. *n revised august 22, 2013 page 18 of 18 mobl is a registered trademark, and more battery life is a trademark of cypress semiconductor. all products and company names m entioned in this document may be the trademarks of their respective holders. cy62147ev30 mobl ? ? cypress semiconductor corporation, 2004-2013. the information contained herein is subject to change without notice. cypress s emiconductor corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a cypress product. nor does it convey or imply any license under patent or other rights. cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement wi th cypress. furthermore, cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. the inclusion of cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies cypress against all charges. any source code (software and/or firmware) is owned by cypress semiconductor corporation (cypress) and is protected by and subj ect to worldwide patent protection (united states and foreign), united states copyright laws and internatio nal treaty provisions. cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the cypress source code and derivative works for the sole purpose of creating custom software and or firmware in su pport of licensee product to be used only in conjunction with a cypress integrated circuit as specified in the applicable agreement. any reproduction, modification, translation, compilation, or repre sentation of this source code except as specified above is prohibited without the express written permission of cypress. disclaimer: cypress makes no warranty of any kind, express or implied, with regard to this material, including, but not limited to, the implied warranties of merchantability and fitness for a particular purpose. cypress reserves the right to make changes without further notice to t he materials described herein. cypress does not assume any liability arising out of the application or use of any product or circuit described herein. cypress does not authori ze its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. the inclusion of cypress? prod uct in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies cypress against all charges. use may be limited by and subject to the applicable cypress software license agreement. sales, solutions, and legal information worldwide sales and design support cypress maintains a worldwide network of offices, solution center s, manufacturer?s representatives, and distributors. to find t he office closest to you, visit us at cypress locations . products automotive cypress.co m/go/automotive clocks & buffers cypress.com/go/clocks interface cypress. com/go/interface lighting & power control cypress.com/go/powerpsoc cypress.com/go/plc memory cypress.com/go/memory psoc cypress.com/go/psoc touch sensing cyp ress.com/go/touch usb controllers cypress.com/go/usb wireless/rf cypress.com/go/wireless psoc ? solutions psoc.cypress.com/solutions psoc 1 | psoc 3 | psoc 4 | psoc 5lp cypress developer community community | forums | blogs | video | training technical support cypress.com/go/support


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